| S.No. | Name of the Author(s) | Title of Patent | Appliation No. | Data of Appliation/Publication | Publication Reference |
|---|---|---|---|---|---|
| 1 | Dr.V.V.A.S.Lakshmi | System to identify rare defects in a micro scale product using machine learning | 202041027346 | 10-07-2020 | India |
Department of CSE(AIML, CS, DS) – Patents
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